This system is designed for broad-area one-shot 50 Megapixel inspection of complex components and geometries. Geometries must be mostly planar due to dept-of-field constraints, however fixturing can be used to support various different components at the appropriate focus plane. From snapshot to analysis/results can be achieved in ~4-5 seconds depending on the complexity of the analysis. The system can accommodate both front and back diffuse illumination. The software architecture is based on OpenCV and fully opened for custom automation and image processing tailored specifically to your application. Furthermore, this system can be customized to drive the inspection measurements via DXF CAD input at arbitrary sampling densities, allowing very high density characterization not otherwise possible with manually configured measurement systems. The sample images below show approximately 40,000 fludic-channel width measurements executed in ~4-5 seconds from capture to reporting.

LIVIS01R1 Features

• Up to 50 Megapixel Image Aquisition
• Intel I3, I5 or I7 computing power (Intel NUC based)
• Fully open and customizable OpenCV image processing
• Lateral entry/exit panels for conveyor compatibility

Downloads

• LIVIS01R1 Sample Images

For additional information, please inquire info@capellarobotics.com